EM TIC 3X Configurable Ion Beam Milling System
Create high-quality milling surfaces using three broad beams, revealing true sample structures for downstream Electron Microscopy analysis. Adaptable and flexible, the EM TIC 3X supports a broad range of experiments with easily exchangeable stages and sample holder compatibility.
For research use only
Precise Surface Preparation. Simplified by Design.
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Reveal true structure and composition of the sample
EM TIC 3X prepares buried structures for EM analysis providing pristine surface quality, aligning samples precisely, and efficiently milling multi-layered foils with minimal redeposition and delamination.
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Surface preparation workflow connectivity
Maintain consistent sample orientation and support. Use the same holder for EM TXP and EM TIC 3X, increasing efficiency and reducing handling steps. Ensure accuracy and efficiency throughout the surface preparation workflow.
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Simple by design, configure and expand to your needs
Enable new experiments with easily exchangeable stages. Achieve desired outcomes through intuitive design, reducing errors and setup time. Expand EM TIC 3X without downtime.
Pristine surfaces empower users to obtain relevant results
Prepare high quality surface of various sample types, no matter if hard, soft, brittle, heterogenic, or heat sensitive. EM TIC 3X helps reveal internal sample structures producing pristine surface quality.
- Create high-quality milling surfaces using three broad beams, without the need of stage rotation.
- Obtain largest cross section area to reach highest analyses yield.
- Choose from five stages and multiple sample holders.
Caption: 1: Cross section of SiC abrasive paper; 2: Cross section of veneer; 3: Coaxial polymer fiber (water soluble) prepared at -120°C; 4: Oil shale (nano pores), revealed with the EM TIC 3X (rotary stage) total sample size Ø 25 mm
Easily prepare buried structures
Never miss your target structure – even if it's a buried feature. Precisely align the sample with mask and ion guns using a stereo microscope. Observe and document the entire process.
Triple ion beam aligned with sample and standard mask
Efficiently prepare foil samples
Prepare cross-sections of single or multiple layers of foils with minimal redeposition or delamination. Successfully mill a variety of foil types to eliminate the artifacts from mechanical preparation and enable high-resolution SEM analysis of battery components.
SEM images of Lithium Ion Battery (LIB) trilayer polymer separator prepared in atmosphere-controlled workflow. Courtesy: Prof. Dr-Ing. Silke Christiansen INAM eV laboratory, Forchheim, Germany.
Enable a new range of experiments as needed
Get a new stage to expand your range of experiments, with no need for service support or instrument downtime, even for cryo stages.
- Standard stage
- Multiple-sample stage
- Rotary stage
- Cooling stage
- Vacuum Cryo Transfer Docking Station
EM TIC 3X is compatible with other Leica instruments including EM VCT500 and EM ACE600.
Accommodate different workflows with easily exchangeable stages.
